Fig. 2
![Fig. 2](http://media.springernature.com/full/springer-static/image/art%3A10.1186%2Fs13071-016-1945-z/MediaObjects/13071_2016_1945_Fig2_HTML.gif)
Differentially expressed genes (DEG) found in common across comparisons of tick-infested skin. Genes involved in common in anti-tick responses as well as potential signatures for tick resistance were identified. a Venn diagram showing number of DEGs between Str skins versus Lar or Nym skins comparisons within each breed (intra-breed comparison). Numbers inside brackets indicate the number of genes that were upregulated (red), downregulated (green) or of mixed pattern (blue). b Hierarchical clustering of expression pattern of six genes found in both overlaps of intra-breed comparisons shown in Fig. 2a. Color bar represent the log2 transformation of fold change values (-1.0 to 3.0) from infested skins when compared to normal skin within same breed; green and red means downregulated and upregulated genes, respectively. Abbreviations: S, tick-susceptible hosts; R, tick-resistant hosts; Bsl, baseline skin skin; Str, stressed skin; Lar, larvae-infested skin; Nym, nymph-infested skin